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美国1号仓库<\/strong> 查看更多相关产品<\/a><\/span><\/div>

参考图片<\/td> 制造商 \/ 描述 \/ 型号 \/ 仓库库存编号 \/ 别名<\/td> PDF<\/td><\/tr>

<\/a><\/td> Texas Instruments<\/b>
IC SCAN TEST DEVICE 28SOIC<\/span><\/a>
详细描述：Scan Test Device with Bus Transceiver and Registers IC 28-SOIC

型号：SN74ABT8646DWRG4<\/a>
仓库库存编号：SN74ABT8646DWRG4-ND<\/a>
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参考图片<\/td>	制造商 \/ 描述 \/ 型号 \/ 仓库库存编号 \/ 别名<\/td>	PDF<\/td><\/tr>
<\/a><\/td>	Texas Instruments<\/b> IC SCAN TEST DEVICE 28SOIC<\/span><\/a> 详细描述：Scan Test Device with Bus Transceiver and Registers IC 28-SOIC 型号：SN74ABT8646DWRG4<\/a> 仓库库存编号：SN74ABT8646DWRG4-ND<\/a> <\/td>	<\/a> <\/div> 无铅<\/td><\/tr><\/table>";