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参考图片<\/td> 制造商 \/ 描述 \/ 型号 \/ 仓库库存编号 \/ 别名<\/td> PDF<\/td>操作<\/td> <\/tr>

Texas Instruments - SN74ABT18640DL - IC SCAN-TEST-DEV/TXRX 56-SSOP<\/a><\/td>		Texas Instruments<\/b>
IC SCAN-TEST-DEV/TXRX 56-SSOP<\/span><\/a>
详细描述：Scan Test Device with Inverting Bus Transceivers IC 56-SSOP

型号：SN74ABT18640DL<\/a>
仓库库存编号：296-3942-5-ND<\/a>
别名：296-3942-5 <br>SN74ABT18640DLG4 <br>SN74ABT18640DLG4-ND <br> <\/td>		搜索<\/a><\/td><\/tr>

Texas Instruments - SN74ABT18640DLR - IC SCAN TEST DEVICE 18BIT 56SSOP<\/a><\/td>		Texas Instruments<\/b>
IC SCAN TEST DEVICE 18BIT 56SSOP<\/span><\/a>
详细描述：Scan Test Device with Inverting Bus Transceivers IC 56-SSOP

型号：SN74ABT18640DLR<\/a>
仓库库存编号：SN74ABT18640DLR-ND<\/a>
<\/td>		搜索<\/a><\/td><\/tr>

Texas Instruments - SN74ABT18640DLRG4 - IC SCAN TEST DEVICE 18BIT 56SSOP<\/a><\/td>		Texas Instruments<\/b>
IC SCAN TEST DEVICE 18BIT 56SSOP<\/span><\/a>
详细描述：Scan Test Device with Inverting Bus Transceivers IC 56-SSOP

型号：SN74ABT18640DLRG4<\/a>
仓库库存编号：SN74ABT18640DLRG4-ND<\/a>
<\/td>		搜索<\/a><\/td><\/tr><\/table>";